Stochastic Simulation of Recombination of Electrons and Holes in Two-Dimensional and Three-Dimensional Inhomogeneous Semiconductors. Part I. Stochastic Model and Algorithms Part II. Simulation Results
ISSN 8756-6990, Optoelectronics, Instrumentation and Data Processing, 2017, Vol. 53, No. 1- 2 pp. 1–7. (Автометрия, 2017, Т. 53, № 1-2, Стр. 117-124)